发明名称 Methods and apparatus for diagnosing a degree of interference between a plurality of faults in a system under test
摘要 A method for diagnosing a degree of interference between a plurality of faults in a system under test, the faults being detected by means of applying a test suite to the system under test, includes: 1) for each of the plurality of faults, and for each of a plurality of test syndromes, where a test syndrome is a pattern of passing and failing tests of the test suite, determining relative frequencies at which particular ones of the faults are coupled with particular ones of the syndromes; and 2) using the relative frequencies at which particular ones of the faults are coupled with particular ones of the syndromes to calculate and display to a user, via a graphical user interface, and for the test suite as a whole, test suite degrees of interference between pairs of the faults. Other embodiments are also disclosed.
申请公布号 US7673210(B2) 申请公布日期 2010.03.02
申请号 US20060581142 申请日期 2006.10.12
申请人 AGILENT TECHNOLOGIES, INC. 发明人 BENVENGA CARL E.
分类号 G06F11/00 主分类号 G06F11/00
代理机构 代理人
主权项
地址
您可能感兴趣的专利