| 摘要 |
The declared invention relates to analytical instrument making, in particular, to the methods of calibration models formation for measuring instruments of various kinds. This method for producing multidimensional calibrating patterns includes selection of calibration set samples with known secondary properties; measurement primary properties of every sample on the reference instrument; artificial alteration, at least, in one of the properties, affecting the measurement results of the device; measurement of the primary properties, at least, in one sample on the device in the thus changed state, differing with the fact that before the alteration a set of samples for calculation of correcting relationships is formed, the primary properties of each sample from this set are measured on the device before and after the alterations, and, comparing, by means of the multivariate regressive analysis methods, the measurement results of the primary properties of the samples of the set, received on the instrument before the alterations, with the measurement results of the primary properties of the same samples, received on the device in the state, when changes are made, define the correcting relationships; carry out transformation of the measurement results of the calibration set samples' primary properties by means of the received correcting relationships to the form, corresponding to the measurements on the device after the alteration; the corrected in such way to the changed state of the device with primary properties measurement results of the calibration set samples, are supplemented with the measurement results of the calibration samples primary properties, received on the device before the alteration, the multivariate calibration model is calculated by the population of the initial and corrected measurement results of the primary properties of the calibration set samples, and its check, defining on the basis of it the quantitative parameters of the calibration validation, is made. The inventive result of the present method is aimed at producing multidimensional calibrating pattern stable to modifications of properties affecting measuring results of a device. |
