发明名称 INTEGRATED CIRCUIT SYSTEM INCLUDING NITRIDE LAYER TECHNOLOGY
摘要 <p>An integrated circuit system including loading a wafer into a processing chamber and pre-purging the processing chamber with a first ammonia gas. Depositing a first nitride layer over the wafer and purging the processing chamber with a second ammonia gas. Depositing a second nitride layer over the first nitride layer that is misaligned with the first nitride layer. Post- purging the processing chamber with a third ammonia gas and purging the processing chamber with a nitrogen gas.</p>
申请公布号 SG158849(A1) 申请公布日期 2010.02.26
申请号 SG20100000040 申请日期 2007.07.04
申请人 CHARTERED SEMICONDUCTOR MANUFACTURING LTD 发明人 NAGARAD SRIPAD SHESHAGIRI;WENG KOH HWA;KYUN SOHN DONG;XIAOYU CHEN;LIM LOUIS;MUN JUNG SUNG;WAH YAP CHIEW;YELEHANKA PRADEEP RAMACHANDRAMURTHY;KAMAT NITIN
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