发明名称 SUBMERGED WAFER SEPARATING METHOD, AND SUBMERGED WAFER SEPARATING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a wafer separating method and a wafer separating apparatus, which can separate a very thin wafer in a safe, simple, reliable and rapid manner. Ž<P>SOLUTION: The wafer separating method includes separating the uppermost layer wafer from a wafer laminate comprising a number of or a plurality of wafers stacked on top of each other and immersed in a liquid. The wafer separating method includes: a step of holding the uppermost layer wafer in an axial direction which is deviated by an angle of 15 to 75° clockwise or anticlockwise from a crystal habit line axis of the uppermost layer wafer; a step of, while warping the peripheral part of the uppermost layer wafer upward so as to cause bending stress of the uppermost layer wafer in the axial direction, blowing a liquid into between the lower surface of the uppermost layer wafer and the upper surface of a wafer located on and adjacent to the lower side of the uppermost layer wafer; and a step of lifting the uppermost layer wafer to separate the wafer. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010045057(A) 申请公布日期 2010.02.25
申请号 JP20060329540 申请日期 2006.12.06
申请人 MIMASU SEMICONDUCTOR INDUSTRY CO LTD 发明人 TSUCHIYA MASATO;MASHITA IKUO;SAITO KOICHI
分类号 H01L21/677;B65G49/07 主分类号 H01L21/677
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