发明名称 |
Systems and Methods for Handling Negative Bias Temperature Instability Stress in Memory Bitcells |
摘要 |
A system and method reduce stress caused by NBTI effects by determining if a trigger event has occurred and if so inverting all input data values to the memory and all output data values from the memory during a period of time defined by the determined trigger event. In one embodiment, the trigger event is an alternate memory power-up.
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申请公布号 |
US2010046276(A1) |
申请公布日期 |
2010.02.25 |
申请号 |
US20080194342 |
申请日期 |
2008.08.19 |
申请人 |
QUALCOMM INCORPORATED |
发明人 |
CHEN NAN;ZHONG CHENG;CHABA RITU |
分类号 |
G11C11/00;G11C5/14;G11C7/00 |
主分类号 |
G11C11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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