发明名称 Systems and Methods for Handling Negative Bias Temperature Instability Stress in Memory Bitcells
摘要 A system and method reduce stress caused by NBTI effects by determining if a trigger event has occurred and if so inverting all input data values to the memory and all output data values from the memory during a period of time defined by the determined trigger event. In one embodiment, the trigger event is an alternate memory power-up.
申请公布号 US2010046276(A1) 申请公布日期 2010.02.25
申请号 US20080194342 申请日期 2008.08.19
申请人 QUALCOMM INCORPORATED 发明人 CHEN NAN;ZHONG CHENG;CHABA RITU
分类号 G11C11/00;G11C5/14;G11C7/00 主分类号 G11C11/00
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