Method for testing test object e.g. printed circuit board, in workshop during repair for quality control of object, involves accelerating field-programmable gate array unit with inverted reading direction so that program data is loaded

摘要

The method involves coupling a field-programmable gate array (FPGA) unit with a configuration memory (3) e.g. parallel flash memory, in which operating program data is stored in a preset readout direction (A1) so that the data is loaded during acceleration of the FPGA unit in a normal operation. Test program data are stored in a configuration memory (3) and readable in a direction opposite to the reading direction. The preset reading direction is reversed to configure the FPGA unit. The unit is accelerated with inverted reading direction (A2) so that the program data is loaded. Independent claims are also included for the following: (1) a test object with a field-programmable gate array unit (2) a testing system for reading a test data from a test object.