发明名称 |
FIELD EFFECT TRANSISTOR AND METHOD OF MANUFACTURING FIELD EFFECT TRANSISTOR |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a field effect transistor having low on resistance and a high breakdown voltage and channel mobility, and to provide a method of manufacturing the field effect transistor. <P>SOLUTION: The field effect transistor has a MOS structure and includes a nitride-based compound semiconductor. The field effect transistor has: a semiconductor layer that is formed on a substrate and has a prescribed conductivity type; a contact layer that is formed between the semiconductor layer, and source and drain electrodes by epitaxial growth and has a conductivity type opposite to the prescribed one; and a field relaxing layer that is formed between a contact layer at the side of the drain electrode and the semiconductor layer by epitaxial growth while the field relaxing layer is superposed on the gate electrode via a gate insulation film, and has a conductivity type opposite to the prescribed one and a carrier concentration lower than that of the contact layer. <P>COPYRIGHT: (C)2010,JPO&INPIT</p> |
申请公布号 |
JP2010045073(A) |
申请公布日期 |
2010.02.25 |
申请号 |
JP20080206258 |
申请日期 |
2008.08.08 |
申请人 |
FURUKAWA ELECTRIC CO LTD:THE |
发明人 |
NOMURA TAKEHIKO;NIIYAMA YUUKI;KANBAYASHI HIROSHI;YOSHIDA KIYOTERU |
分类号 |
H01L29/786;H01L21/338;H01L21/8234;H01L27/06;H01L27/08;H01L29/47;H01L29/778;H01L29/78;H01L29/812;H01L29/872 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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