发明名称 SOLDER JOINT RELIABILITY IN MICROELECTRONIC PACKAGING
摘要 A microelectronic assembly and method for fabricating the same are described. In an example, a microelectronic assembly includes a microelectronic device having a surface with one or more areas to receive one or more solder balls, the one or more areas having a surface finish comprising Ni. A solder material comprising Cu, such as flux or paste, is applied to the Ni surface finish and one or more solder balls are coupled to the microelectronic device by a reflow process that forms a solder joint between the one or more solder balls, the solder material comprising Cu, and the one or more areas having a surface finish comprising Ni.
申请公布号 US2010044848(A1) 申请公布日期 2010.02.25
申请号 US20090610211 申请日期 2009.10.30
申请人 SUH DAEWOONG;LEHMAN JR STEPHEN E;RENAVIKAR MUKUL 发明人 SUH DAEWOONG;LEHMAN, JR. STEPHEN E.;RENAVIKAR MUKUL
分类号 H01L23/485 主分类号 H01L23/485
代理机构 代理人
主权项
地址
您可能感兴趣的专利