发明名称 IMPRINT LITHOGRAPHY
摘要 An imprint lithography apparatus is disclosed that has a first support structure arranged to support an imprint template, and a first actuator attached to the first support structure, and arranged in use to be located between the first support structure and the imprint template. The first actuator is configured to apply a force to the imprint template. The imprint lithography apparatus further includes a second support structure and a second actuator located between the second support structure and the first support structure. The second actuator is configured to apply a force to the second support structure, wherein a range of movement of the second actuator is greater than a range of movement of the first actuator.
申请公布号 US2010044917(A1) 申请公布日期 2010.02.25
申请号 US20090468743 申请日期 2009.05.19
申请人 ASML NETHERLANDS B.V. 发明人 KRUIJT-STEGEMAN YVONNE WENDELA;JEUNINK ANDRE BERNARDUS;BERNARDUS, VERMEULEN JOHANNES PETRUS, MARTINUS;WUISTER SANDER FREDERIK;LAFARRE RAYMOND WILHELMUS, LOUIS;DE SCHIFFART CATHARINUS;JANSEN NORBERT ERWIN THERENZO
分类号 B29C59/02 主分类号 B29C59/02
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