发明名称 METHOD OF MANUFACTURING GROUP-III NITRIDE SEMICONDUCTOR LAYER BONDED SUBSTRATE
摘要 <P>PROBLEM TO BE SOLVED: To provide a group-III nitride semiconductor layer bonded substrate high in the crystallinity of a group-III nitride semiconductor layer. <P>SOLUTION: The method of manufacturing a group-III nitride semiconductor layer bonded substrate includes: a process of implanting ions I of at least one of hydrogen and helium in a region of a prescribed depth D from one main surface 20m of a group-III nitride semiconductor substrate 20; a process of bonding a different kind substrate 10 with the main surface 20m of the group-III nitride semiconductor substrate 20; a process of obtaining a group-III nitride semiconductor layer bonded substrate 1 by separating the group-III nitride semiconductor substrate 20 in a region 20i implanted with the ions I; and a process of annealing the group-III nitride semiconductor layer bonded substrate 1 at a temperature not lower than 700&deg;C in an atmosphere of a nitrogen-containing gas N. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010045098(A) 申请公布日期 2010.02.25
申请号 JP20080206933 申请日期 2008.08.11
申请人 SUMITOMO ELECTRIC IND LTD 发明人 YAGO AKIHIRO
分类号 H01L21/02;H01L21/20;H01L21/265;H01L33/32;H01S5/343 主分类号 H01L21/02
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