发明名称 |
METHOD OF MANUFACTURING GROUP-III NITRIDE SEMICONDUCTOR LAYER BONDED SUBSTRATE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a group-III nitride semiconductor layer bonded substrate high in the crystallinity of a group-III nitride semiconductor layer. <P>SOLUTION: The method of manufacturing a group-III nitride semiconductor layer bonded substrate includes: a process of implanting ions I of at least one of hydrogen and helium in a region of a prescribed depth D from one main surface 20m of a group-III nitride semiconductor substrate 20; a process of bonding a different kind substrate 10 with the main surface 20m of the group-III nitride semiconductor substrate 20; a process of obtaining a group-III nitride semiconductor layer bonded substrate 1 by separating the group-III nitride semiconductor substrate 20 in a region 20i implanted with the ions I; and a process of annealing the group-III nitride semiconductor layer bonded substrate 1 at a temperature not lower than 700°C in an atmosphere of a nitrogen-containing gas N. <P>COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2010045098(A) |
申请公布日期 |
2010.02.25 |
申请号 |
JP20080206933 |
申请日期 |
2008.08.11 |
申请人 |
SUMITOMO ELECTRIC IND LTD |
发明人 |
YAGO AKIHIRO |
分类号 |
H01L21/02;H01L21/20;H01L21/265;H01L33/32;H01S5/343 |
主分类号 |
H01L21/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|