发明名称 DEFECT HEIGHT ESTIMATION METHOD BY ULTRASONIC FLAW DETECTION
摘要 PROBLEM TO BE SOLVED: To provide a defect height estimation method by ultrasonic flaw detection capable of precisely estimating a defect height of planar defects present inside a body to be inspected. SOLUTION: In the defect height estimation method by ultrasonic flaw detection, ultrasonic waves are transmitted from an ultrasonic probe arranged on the surface of the body to be inspected to the interior of the body to be detected and defect height of planar defects existing inside the body to be inspected is estimated from the waveform of reflection waves reflected from a reflection source. In the defect height estimation method, a sensitivity calibration level Ac is set in advance by performing ultrasonic flaw detection by a test piece for calibration having a reflection source with a surface in the inside, defect echoes of planar defects are detected by transmitting ultrasonic waves from the ultrasonic probe to the body to be inspected, and defect height of planar defects is estimated from the detected defect echoes by a calculation formula having, as coefficients, the reflection area of the test piece for calibration, a sensitivity calibration level, and the diameter of ultrasonic beams at a detection position of planar defects. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010043989(A) 申请公布日期 2010.02.25
申请号 JP20080209018 申请日期 2008.08.14
申请人 MITSUBISHI HEAVY IND LTD 发明人 KAMIBAYASHI MASAKAZU;TSURUOKA SEIJI;SAKAMOTO KEIGO;YAGITA HIROYUKI;OKABE YU
分类号 G01N29/04;G01N29/00;G01N29/30;G01N29/44 主分类号 G01N29/04
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