| 摘要 |
<P>PROBLEM TO BE SOLVED: To easily calculate an error rate for each test pattern. Ž<P>SOLUTION: There is provided a test module for testing a device to be tested, which includes: a pattern generation part for generating a test pattern given to the device to be tested and an expected value pattern corresponding to the test pattern based on a pattern program; an output pattern obtaining part for obtaining an output pattern output by the device to be tested which gives the test pattern; a comparing part for comparing the output pattern with the expected value pattern; a fail counter for counting the number of times of output of fail information output when the output pattern in the comparing part does not coincide with the expected value pattern; and a control part for controlling operation of the fail counter by a control command included in the pattern program. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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