CAPACITANCE CHANGE MEASURING CIRCUIT FOR CAPACITANCE TYPE SENSOR DEVICE, CAPACITANCE TYPE SENSOR MODULE, CAPACITANCE CHANGE MEASURING METHOD FOR CAPACITANCE TYPE SENSOR DEVICE, AND ELECTRONIC APPARATUS

摘要

PROBLEM TO BE SOLVED: To provide a technology capable of accelerating a scan speed with respect to the detection technology of operation input or position input to a capacitance type sensor device.

SOLUTION: The capacitance change measuring circuit for the capacitance type sensor device includes: (1) an electrode driving part for sequential input of an input pulse signal in a prescribed cycle to the first electrode pattern of a plurality of columns configuring the capacitance type sensor device; (2) a peak hold circuit for storing the peak level of a detection signal to be extracted through the second electrode pattern of a plurality of columns crossing with the first electrode pattern in another layer in a capacitative element as a corresponding potential; (3) a current source for initializing the potential of the capacitative element within one cycle of the input signal; (4) a comparator for comparing the held potential of the capacitative element with a reference value; and (5) a plurality of decision parts for deciding the presence of an operation input by a person or an object having equivalent electric characteristics based on reference timing information set for each propagation path of the input pulse signal.

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