发明名称 DEFECT CORRECTION METHOD AND DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a defect correction method, decreasing a resistance value of a correcting part. Ž<P>SOLUTION: According to this defect correction method, a correction layer 5 containing metal material is formed to cover a breaking of wire defect part 3 of a wire 2 formed on a glass substrate 1 and part of a normal part of the wire 2 existing at both ends thereof, laser light α is applied to each of two overlapping regions of the correction layer 5 and the wire 2, thereby welding the correction layer 5 and the wire 2 to each other in the respective regions. Thus, even when an oxidation layer exists on the surface of the wire 2, the correction layer 5 and the wire 2 are fused and fixed in the respective regions so that the resistance value of the correcting part can be decreased. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010044231(A) 申请公布日期 2010.02.25
申请号 JP20080208432 申请日期 2008.08.13
申请人 NTN CORP 发明人 SHIMIZU SHIGEO
分类号 G09F9/00;G02F1/1343 主分类号 G09F9/00
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