发明名称 RETAINER RING FOR CMP EQUIPMENT
摘要 <P>PROBLEM TO BE SOLVED: To provide a retainer ring for CMP equipment, which can continue to properly polish a to-be-polished surface of a wafer even if a side face on the outer periphery side of the retainer ring is brought into contact with other member. <P>SOLUTION: On a side face 8f on the outer periphery side of a retainer ring, an amorphous hard carbon film 81 is formed. Since the hard carbon film 81 has a high hardness, a high wear resistance, and a low friction coefficient, and is smooth and has a high lubricant property, even if the side face 8f is brought into contact with other member and is repeatedly done so, the side face 8f does not wear and suffer a loss, deformation, etc. Consequently, a uniform contact between a pressing surface 8a of the retainer ring 8 and a polishing surface 3a of a polishing pad 3 is maintained, making it possible for the retainer ring to continue to properly polish a to-be-polished surface W1 of a wafer W. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010045194(A) 申请公布日期 2010.02.25
申请号 JP20080208299 申请日期 2008.08.13
申请人 NIPPON SEIMITSU DENSHI CO LTD 发明人 ICHINOSHIME TSUTOMU
分类号 H01L21/304;B24B37/32 主分类号 H01L21/304
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