发明名称 Non-volatile memory device with conductive sidewall spacer and method for fabricating the same
摘要 The present invention relates to a non-volatile memory device having conductive sidewall spacers and a method for fabricating the same. The non-volatile memory device includes: a substrate; a gate insulation layer formed on the substrate; a gate structure formed on the gate insulation layer; a pair of sidewall spacers formed on sidewalls of the gate structure; a pair of conductive sidewall spacers for trapping/detrapping charges formed on the pair of sidewall spacers; a pair of lightly doped drain regions formed in the substrate disposed beneath the sidewalls of the gate structure; and a pair of source/drain regions formed in the substrate disposed beneath edge portions of the pair of conductive sidewall spacers.
申请公布号 US7667253(B2) 申请公布日期 2010.02.23
申请号 US20070790957 申请日期 2007.04.30
申请人 HYNIX SEMICONDUCTOR, INC. 发明人 LIM KWAN-YONG;CHO HEUNG-JAE;KIM YONG-SOO;JANG SE-AUG;SOHN HYUN-CHUL
分类号 H01L27/108;H01L29/94 主分类号 H01L27/108
代理机构 代理人
主权项
地址
您可能感兴趣的专利