发明名称 Split-gate memory cells and fabrication methods thereof
摘要 Split-gate memory cells and fabrication methods thereof. A split-gate memory cell comprises a plurality of isolation regions formed on a semiconductor substrate along a first direction, between two adjacent isolation regions defining an active region having a pair of drains and a source region. A top level of the active regions is lower than a top level of the isolation regions. A pair of floating gates is disposed on the active regions and aligned with the isolation regions, wherein a passivation layer is disposed on the floating gate to prevent thinning from CMP. A pair of control gates is self-aligned with the floating gates and disposed on the floating gates along a second direction. A source line is disposed between the pair of control gates along the second direction. A pair of select gates is disposed on the outer sidewalls of the pair of control gates along the second direction.
申请公布号 US7667261(B2) 申请公布日期 2010.02.23
申请号 US20070785382 申请日期 2007.04.17
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD 发明人 HSIEH CHANG-JEN;SUNG HUNG-CHENG;CHU WEN-TING;HUANG CHEN-MING;KAO YA-CHEN;LIU SHIH-CHANG;LO CHI-HSIN;YU CHUNG-YI;TSAI CHIA-SHIUNG
分类号 H01L29/788 主分类号 H01L29/788
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