发明名称 Method of forming device isolation film of semiconductor device
摘要 A method of forming a device isolation film of a semiconductor device is provided. The method of forming a device isolation film of a semiconductor device according to an embodiment includes forming the device isolation film by ion-implanting insulation materials inside of a trench formed on a semiconductor substrate.
申请公布号 US7666755(B2) 申请公布日期 2010.02.23
申请号 US20070842715 申请日期 2007.08.21
申请人 DONGBU HITEK CO., LTD. 发明人 PARK JIN HA
分类号 H01L21/00 主分类号 H01L21/00
代理机构 代理人
主权项
地址