发明名称 SEMICONDUCTOR DEVICE, AND MANUFACTURING METHOD THEREOF
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device having a diode having an extremely low rise voltage and a high withstand reverse voltage of a degree causing no practical problem, and to provide a manufacturing method thereof. <P>SOLUTION: The semiconductor device includes an N-type semiconductor layer 1 containing indium with a surface on which an indium oxide layer 2 with a thickness allowing generation of a two-dimensional electron gas and tunneling of electrons of the two-dimensional gas is formed. A first electrode 3 of a metal or conductive oxide film is formed on the indium oxide layer 2 and a second electrode 4 is formed to be electrically connected with the N-type semiconductor layer (N-type semiconductor substrate) 1. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2010040970(A) 申请公布日期 2010.02.18
申请号 JP20080205314 申请日期 2008.08.08
申请人 KIMURA CHIKAO;NEW JAPAN RADIO CO LTD;CHEMITORONICS CO LTD 发明人 KIMURA CHIKAO
分类号 H01L29/861;H01L21/28;H01L29/88 主分类号 H01L29/861
代理机构 代理人
主权项
地址