发明名称 |
SEMICONDUCTOR DEVICE, AND MANUFACTURING METHOD THEREOF |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device having a diode having an extremely low rise voltage and a high withstand reverse voltage of a degree causing no practical problem, and to provide a manufacturing method thereof. <P>SOLUTION: The semiconductor device includes an N-type semiconductor layer 1 containing indium with a surface on which an indium oxide layer 2 with a thickness allowing generation of a two-dimensional electron gas and tunneling of electrons of the two-dimensional gas is formed. A first electrode 3 of a metal or conductive oxide film is formed on the indium oxide layer 2 and a second electrode 4 is formed to be electrically connected with the N-type semiconductor layer (N-type semiconductor substrate) 1. <P>COPYRIGHT: (C)2010,JPO&INPIT</p> |
申请公布号 |
JP2010040970(A) |
申请公布日期 |
2010.02.18 |
申请号 |
JP20080205314 |
申请日期 |
2008.08.08 |
申请人 |
KIMURA CHIKAO;NEW JAPAN RADIO CO LTD;CHEMITORONICS CO LTD |
发明人 |
KIMURA CHIKAO |
分类号 |
H01L29/861;H01L21/28;H01L29/88 |
主分类号 |
H01L29/861 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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