| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide an optical delay device capable of enhancing measuring precision. <P>SOLUTION: Linear polarized probe light transmitted through (or reflected from) a polarizer is subjected to circular polarization by a 1/4 wavelength plate and returned to the 1/4 wavelength plate by a mirror to be converted to linear polarized light, which crosses the linear polarized probe light incident from the polarizer at a right angle, to be reflected from (or transmitted through) the polarizer. Accordingly, when the light path length of the probe light is displaced by the light path length displacing part arranged between the polarizer and the 1/4 wavelength plate, the displacement twice the forward path from the polarizer to the mirror and the return path from the mirror to the polarizer can be applied to the light path length of the probe light, so that the arriving time of the probe light can be delayed much more as compared with a case that the light path length of one-way probe light is displaced. <P>COPYRIGHT: (C)2010,JPO&INPIT</p> |
