发明名称 |
METHOD AND APPARATUS FOR DETECTING THIN REGION |
摘要 |
PROBLEM TO BE SOLVED: To provide a method and an apparatus for detecting a thin region without previously preparing comparison data. SOLUTION: Measurement points mp are designated in the region na having a fixed thickness and the region having the unknown thickness on a surface of a wall. A temperature is sequentially measured at each measurement point during at least one of heating and natural cooling. A temperature data group is obtained, and includes temperature data corresponding to a time at each measurement point mp. A similarity between a reference data group obtained at the measurement point sp designated in the region na having the fixed thickness and a comparison data group obtained at the measurement point cp designated in the region ns having the unknown thickness is derived. Since the degree of the thickness of the wall at the measurement point cp from which the comparison data group is obtained to the wall at the measurement point sp from which the reference data group is obtained is derived based on the similarity, the thin region ta is detected. COPYRIGHT: (C)2010,JPO&INPIT
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申请公布号 |
JP2010038570(A) |
申请公布日期 |
2010.02.18 |
申请号 |
JP20080198539 |
申请日期 |
2008.07.31 |
申请人 |
SHINKO INSPECTION & SERVICE CO LTD |
发明人 |
ENDO HIDEKI;KUSAKA TAKUYA;SAKAGAMI TAKAHIDE |
分类号 |
G01B21/08;G01B11/06;G01N25/18 |
主分类号 |
G01B21/08 |
代理机构 |
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