发明名称
摘要 <p>Electrical impedance tomography method comprising: an electrical measurement step during which pre-determined electrical conditions are imposed on the surface of a medium to be imaged, while generating a mechanical disturbance at predefined points of the medium by locally modifying the impedance of the medium and an electrical parameter is measured at several points on the surface of the medium; and a calculation step during which the electrical impedance is determined at several points in the internal volume of the medium, taking into account the measurements carried out during the disturbance, as a function of a law for modification of the electrical impedance by this disturbance.</p>
申请公布号 JP2010504781(A) 申请公布日期 2010.02.18
申请号 JP20090529743 申请日期 2007.09.26
申请人 发明人
分类号 A61B5/05 主分类号 A61B5/05
代理机构 代理人
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