| 摘要 |
<p>With a solar cell manufacturing method, structural defects (A1, A2) present in a compartment element (21) are detected. An image (M) is obtained by photographing the region that includes the structural defects (A1, A2) and a scribe line (19). Spacing between mutually adjacent scribe lines (19) or a first number of pixels corresponding to the width of the scribe line (19) is specified. Spacing between mutually adjacent scribe lines (19) which has already been stored or an actual measurement value indicating the width of the scribe line (19) which has already been stored is referenced, and the first number of pixels and the actual measured value are compared to calculate the actual dimension per pixel in the image (M). A second number of pixels corresponding to the distance between the structural defects (A1, A2) and the scribe line (19) is specified, and the second number of pixels and the actual dimension per pixel are compared to calculate defect position information. A laser beam is applied based on the defect position information, and the structural defects (A1, A2) are electrically separated.</p> |
