发明名称 SYSTEM AND METHOD FOR MEASURING REFLECTION CHARACTERISTICS OF TRANSLUCENT MATERIALS
摘要 PURPOSE: A system and a method for measuring the reflectivity of semi-transparent material are provided to precisely measure the reflectivity of material and utilize data of total pixel on an image by minimizing the distortion of image data which are obtained on an optical detecting part. CONSTITUTION: A system for measuring the reflectivity of semi-transparent material comprises a light source(11), a light emitting part(20), an optical fiber(30), and a light detecting part(40). A light emitting part emits the light from the light source to material. The optical fiber conveys the light from the light source to the light emitting part. The light detecting part is apart from the light emitting part. The light detecting part detects the light reflected from the material and obtains the image data.
申请公布号 KR20100019159(A) 申请公布日期 2010.02.18
申请号 KR20080078049 申请日期 2008.08.08
申请人 GWANGJU INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 KIM, HOE MIN;LEE, KWAN HENG;KO, KWANG HEE;LEE, SEUNG JOO;JI, JOONG HYUN
分类号 G01J1/00;G01J1/02 主分类号 G01J1/00
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