发明名称 SOLID-STATE IMAGING ELEMENT
摘要 <P>PROBLEM TO BE SOLVED: To reduce a sensitivity difference between pixels while maintaining a high numerical aperture by allowing a plurality of pixels to share an amplification unit etc. Ž<P>SOLUTION: Each pixel 1 has various transistors in addition to a photodiode PD1 or PD2 for generating and accumulating signal charges corresponding to incident light. Each pixel block 20 includes two pixels 1 having photodiodes PD1 or PD2 arrayed in a column direction. In each pixel block 20, two pixels 1 share a predetermined transistor etc. In each pixel block 20, between one pixel 1-1 out of two pixels 1-1 and 1-2 belonging to the pixel block 20 and the other pixel 1-2, position relation of a microlens ML of each pixel to the photodiode PD of the pixel is different. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010040997(A) 申请公布日期 2010.02.18
申请号 JP20080205564 申请日期 2008.08.08
申请人 NIKON CORP 发明人 KATO YOICHI;NAKAYAMA TOMOHITO
分类号 H01L27/14;H01L27/146;H04N5/335;H04N5/365;H04N5/369;H04N5/374 主分类号 H01L27/14
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