发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, AND PLASMA ETCHING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device improving a selection ratio between a compound semiconductor and a mask. SOLUTION: This method of manufacturing a semiconductor device includes processes of: forming an etching mask on a processing object 10 formed of a compound semiconductor containing indium as an essential constituent element; introducing a mixture gas comprising two constituents such as hydrogen iodide gas and silicon tetrachloride gas onto the processing object 10 and converting the mixture gas to plasma; and entering the mixture gas converted to plasma into the processing object to selectively etch the processing object. The mixture ratio of the flow of the hydrogen iodide gas to the total flow of the mixture gas is 60-85%. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010040777(A) 申请公布日期 2010.02.18
申请号 JP20080202237 申请日期 2008.08.05
申请人 NEC CORP;ULVAC JAPAN LTD 发明人 SUDO SHINYA;OKAMOTO KENJI;KUDO KOJI;HASHIMOTO RYUJI
分类号 H01L21/3065;G02B6/12;G02B6/13 主分类号 H01L21/3065
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