发明名称 METHOD AND MEANS FOR NEAR-FIELD MICROSCOPY BASED ON TRANSIENT PROBES IN A PHASE-CHANGE MATERIAL.
摘要 <p>A slide for carrying a sample (38), for use with a near-field optical microscope (10), comprises a phase-change layer (36). Any region (40) of the phase-change layer is capable of reversibly assuming a first phase or a second phase independently of other regions of the phase-change layer. With regard to illumination light (44), the region's transmittance is substantially higher in the second phase than in the first phase, or the region's reflectivity is substantially higher in the second phase than in the first phase. A method of imaging a sample (38) comprises the steps of placing the sample (38) on a slide of the type described above; creating a probe region (40) in the phase-change layer (36), the probe region being surrounded by a surrounding region (42) of the phase-change layer (36), wherein the surrounding region (42) is in the first phase while the probe region (40) is in the second phase; illuminating the probe region (40) by illumination light (44), whereby illumination light is at least partially transmitted through or reflected by the probe region (40) so as to illuminate a region (50) of the sample (38); and detecting light (48) from the sample (38). A near-field optical microscope comprising a slide as described above is also disclosed.</p>
申请公布号 WO2010018514(A1) 申请公布日期 2010.02.18
申请号 WO2009IB53488 申请日期 2009.08.07
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V.;HULSKEN, BAS;STALLINGA, SJOERD 发明人 HULSKEN, BAS;STALLINGA, SJOERD
分类号 G01Q60/18;G02B21/34 主分类号 G01Q60/18
代理机构 代理人
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