发明名称 METHOD AND APPARATUS FOR MEASURING DISPLACEMENT OF A SAMPLE
摘要 In a displacement measurement apparatus using light interference, a probe light path is spatially separated from a reference light path. Therefore, when a temperature or refractive index distribution by a fluctuation of air or the like, or a mechanical vibration is generated, an optical path difference fluctuates between both of the optical paths, and a measurement error is generated. In the solution, an optical axis of probe light is brought close to that of reference light by a distance which is not influenced by any disturbance, a sample is irradiated with the probe light, a reference surface is irradiated with the reference light, reflected light beams are allowed to interfere with each other, and a displacement of the sample is obtained from the resultant interference light to thereby prevent the measurement error from being generated by the fluctuation of the optical path difference.
申请公布号 US2010039652(A1) 申请公布日期 2010.02.18
申请号 US20090605089 申请日期 2009.10.23
申请人 NAKATA TOSHIHIKO;WATANABE MASAHIRO;BABA SHUICHI;YOSHITAKE YASUHIRO;NOMOTO MINEO 发明人 NAKATA TOSHIHIKO;WATANABE MASAHIRO;BABA SHUICHI;YOSHITAKE YASUHIRO;NOMOTO MINEO
分类号 G01B9/02 主分类号 G01B9/02
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