发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 A method for manufacturing a semiconductor device, includes: bringing a first major surface of a first substrate into close contact with a second major surface of a second substrate being different in thermal expansion coefficient from the first substrate at a first temperature higher than room temperature; and bonding the first substrate and the second substrate by heating the first substrate and the second substrate to a second temperature higher than the first temperature with the first major surface being in close contact with the second major surface.
申请公布号 US2010041209(A1) 申请公布日期 2010.02.18
申请号 US20090539336 申请日期 2009.08.11
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 FURUKAWA KAZUYOSHI
分类号 H01L21/18 主分类号 H01L21/18
代理机构 代理人
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