发明名称 TRANSITION TEMPERATURE MICROSCOPY
摘要 <p>A system and method for automatic analysis of temperature transition data over an area of a sample surface 8. The system relies on the use of a microf abricated probe, 4, which can be rapidly heated and cooled 22 and has a sharp tip 6 to provide high spatial resolution. The system also has fast x- y-z positioners, 18, 20, data collection 29, 30, and algorithms that allow automatic analysis of and visualization 32 of temperature transition data.</p>
申请公布号 WO2010019256(A1) 申请公布日期 2010.02.18
申请号 WO2009US04652 申请日期 2009.08.13
申请人 ANASYS INSTRUMENTS;KJOLLER, KEVIN;SAHAGIAN, KHOREN;GOTTHARD, DOUG;KURTZ, ANTHONY;SHETTY, ROSHAN;PRATER, CRAIG;READING, MICHAEL 发明人 KJOLLER, KEVIN;SAHAGIAN, KHOREN;GOTTHARD, DOUG;KURTZ, ANTHONY;SHETTY, ROSHAN;PRATER, CRAIG;READING, MICHAEL
分类号 G01Q60/58;G01Q30/04 主分类号 G01Q60/58
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