| 摘要 |
<p>The error rate on a test pattern-by-test pattern basis is easily calculated. Provided is a test module for testing a device to be tested comprising a pattern generating section for generating test patterns given to the device to be tested and the expected value patterns corresponding to the test patterns according to a pattern program, an output pattern acquiring section for acquiring the output patterns outputted by the device to be tested to which the test patterns are given, a comparison section for comparing the output patterns and the expected value patterns, a fail counter for counting the number of output of fail information outputted when the comparison of the output patterns and expected value patterns in the comparison section shows inconsistency, and a control unit for controlling the operation of the fail counter according to a control instruction included in the pattern program.</p> |
