发明名称 BEAM SCANNING CHROMATIC CONFOCAL MICROSCOPY
摘要 PURPOSE: A beam scanning chromatic confocal microscope is provided to reduce measurement time since one measurement of any point on X-Y plane is sufficient while minimizing the movement of a measure system. CONSTITUTION: An optical source unit(1) emits a white light or a light in which lights with a plurality of wavelengths are mixed. The collimating lens(3) induces the light coming out from the optical source unit to be parallel with the collimating lens. A beam splitter(5A) divides the collimated light passing through the collimating lens. A scanning system(9) comprises a plurality of mirrors and a driving part rotating the mirrors. The scanning system adjusts the progressive direction of the light passing through the beam splitter and moves the light projected on the specimen in parallel with the plane in which the specimen is placed. An objective lens(12) guides the light passing through the scanning system to the specimen.
申请公布号 KR20100018984(A) 申请公布日期 2010.02.18
申请号 KR20080077771 申请日期 2008.08.08
申请人 NANOSCOPESYSTEMS, INC. 发明人 CHUN, BYUNG SEON;LEE, SEUNG WOO;KIM, TAE JOONG;SONG, IN CHEON
分类号 G02B21/00;G02B21/06 主分类号 G02B21/00
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