发明名称 SYSTEM AND METHOD OF HIGH SPEED MEASUREMENT OF TERAHERTZ WAVE
摘要 PURPOSE: A system and a method of high speed measurement of terahertz wave are provided to obtain a spectrum image of each material by analyzing material required for terahertz wave. CONSTITUTION: An optical delay unit(230) comprises a rotary type reflector having a plurality of wings. The laser beam which is divided at a bema splitter into two paths by using optical delay unit has time difference. The laser beams having time difference is respectively is projected to a terahertz wave generator(200) and a terahertz wave detection unit. The voltage signal is sampled and data of the terahertz wave pulse to the sample is collected. The voltage signal corresponds to the current signal generated in the terahertz wave detection unit. The sample is interposed between the terahertz wave generator and the terahertz wave detection unit.
申请公布号 KR20100018301(A) 申请公布日期 2010.02.17
申请号 KR20080077011 申请日期 2008.08.06
申请人 KOREA ELECTROTECHNOLOGY RESEARCH INSTITUTE 发明人 JIN, YUN SIK;KIM, GEUN JU;JEON, SEOK GY;KIM, JUNG IL;SHON, CHAE HWA
分类号 G01R31/00;G01J3/00 主分类号 G01R31/00
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