| 摘要 |
<p>A probe for position determining apparatus has a probe body (18) and a workpiece-contacting stylus (14). A strain sensitive structure (70) connects the probe body (18) and the stylus (14), and includes at least one bendable member (90) which is bendable relative to the axis when the stylus (14) contacts a workpiece (50). A pair of strain sensing elements (33) are mounted on opposing sides of said bendable member (90), so as to provide respective signals upon bending thereof. A circuit (92) receives said signals and processes them differentially to produce a combined output signal.</p> |
