发明名称 Methods and apparatus for in-situ substrate processing
摘要 A plasma processing system for processing a substrate is disclosed. The plasma processing system includes a gas distribution system. The plasma processing system also includes a gas flow control assembly coupled to the gas distribution system and configured to control a set of input gases provided by the gas distribution system. The plasma processing system further includes a first set of nozzles coupled to the gas flow control assembly and configured to supply a first set of gases for processing a first portion of the substrate. The plasma processing system further includes a second set of nozzles coupled to the gas flow control assembly and configured to supply a second set of gases for processing a second portion of the substrate.
申请公布号 US7662723(B2) 申请公布日期 2010.02.16
申请号 US20060608738 申请日期 2006.12.08
申请人 LAM RESEARCH CORPORATION 发明人 HWANG GUANG-YAW;LUI PU-LUN;YANG YU-WEI
分类号 H01L21/302 主分类号 H01L21/302
代理机构 代理人
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