发明名称 PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD
摘要 A tray (15) of a dry etching apparatus (1) is provided with substrate storing holes (19A-19D) penetrating in the thickness direction, and a substrate supporting section (21) for supporting an outer circumference portion of a lower plane (2a) of a substrate (2). A dielectric board (23) is provided with a tray supporting plane (28) for supporting a lower plane of the tray (15) and substrate placing sections (29A-29D), which are inserted into the substrate storing holes (19A-19D) from the lower plane side of the tray (15) and have the substrate (2) placed on a substrate placing plane (31), i.e., upper end planes of the substrate placing sections. A direct current voltage applying mechanism (43) applies a direct current voltage to an electrostatically attracting electrode (40). A heat transfer gas supplying mechanism (45) supplies a heat transfer gas between the substrate (2) and the substrate placing plane (31). The substrate (2) can be held on the substrate placing plane (31) with high adhesiveness. As a result, cooling efficiency of the substrate (2) is improved and uniform processing over the entire region on a substrate surface including regions close to the outer circumference end is performed.
申请公布号 KR20100017681(A) 申请公布日期 2010.02.16
申请号 KR20097025501 申请日期 2006.10.10
申请人 PANASONIC CORPORATION 发明人 OKITA SHOGO;ASAKURA HIROMI;WATANABE SYOUZOU;HOUCHIN RYUZOU;SUZUKI HIROYUKI
分类号 H01L21/687;H01L21/205;H01L21/3065 主分类号 H01L21/687
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