发明名称 Atomic layer deposition of a ruthenium layer to a lanthanide oxide dielectric layer
摘要 Electronic apparatus and methods of forming the electronic apparatus include a conductive layer having a layer of ruthenium in contact with a lanthanide oxide dielectric layer for use in a variety of electronic systems. The lanthanide oxide dielectric layer and the layer of ruthenium may be structured as one or more monolayers. The lanthanide oxide dielectric layer and the layer of ruthenium may be formed by atomic layer deposition.
申请公布号 US7662729(B2) 申请公布日期 2010.02.16
申请号 US20050117125 申请日期 2005.04.28
申请人 MICRON TECHNOLOGY, INC. 发明人 AHN KIE Y.;FORBES LEONARD
分类号 H01L21/469 主分类号 H01L21/469
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