发明名称 Method for manufacturing semiconductor device background
摘要 To improve a step coverage and a loading effect, without inviting a deterioration of throughput and an increase of cost, in a method for forming a thin film by alternately flowing a raw material and alcohol to a processing chamber. The method includes: loading a silicon wafer having a surface terminated by H into a processing chamber; supplying alcohol to supply the alcohol into the processing chamber as a first gas; first purging to discharge the first gas from an inside of the processing chamber; supplying a raw material to supply a source gas into the processing chamber as a second gas; second purging to discharge the second gas from the inside of the processing chamber; generating a desired thin film on the silicon wafer by setting as one cycle at least the aforementioned supplying alcohol, first purging, supplying the raw material, and second purging, and by repeating this cycle a prescribed number of times; and unloading the silicon wafer, with said desired thin film generated thereon, from the inside of the processing chamber.
申请公布号 US7662727(B2) 申请公布日期 2010.02.16
申请号 US20070979707 申请日期 2007.11.07
申请人 HITACHI KOKUSAI ELECTRIC INC. 发明人 MIYA HIRONOBU;MIZUNO NORIKAZU;SAKAI MASANORI;SASAKI SHINYA;YAMAZAKI HIROHISA
分类号 H01L21/31;H01L21/469 主分类号 H01L21/31
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