| 摘要 |
A semiconductor device verification system capable of verifying operation with great accuracy. A pattern matching verification system outputs interference pattern information. A physical verification system compiles the interference pattern information and a design rule and extracts a design rule applied to the interference pattern information. The physical verification system then refers to the design rule to verify a compared cell list and the interference pattern information. As a result, the physical verification system can perform physical verification of layout data without skipping data regarding the compared cell list.
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