发明名称 Method for forming silicide contacts
摘要 Contacts having different characteristics may be created by forming a first silicide layer over a first device region of a substrate, and then forming a second silicide layer over a second device region while simultaneously further forming the first silicide layer. A first contact hole may be formed in a dielectric layer over a first device region of a substrate. A silicide layer may then be formed in the first contact hole. A second contact hole may be formed after the first contact hole and silicide layer is formed. A second silicidation may then be performed in the first and second contact holes.
申请公布号 US7662716(B2) 申请公布日期 2010.02.16
申请号 US20060355112 申请日期 2006.02.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM HYUN-SU;MOON KWANG-JIN;LEE SANG-WOO;LEE EUN-OK;LEE HO-KI
分类号 H01L21/28;H01L21/44;H01L21/4763 主分类号 H01L21/28
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