发明名称 |
METHOD AND APPARATUS FOR SINGULATED DIE TESTING |
摘要 |
In accordance with one embodiment of the invention, a method of singulated die testing can be implemented. This can be implemented by obtaining a wafer and singulating the dies into individual die pieces. The singulated dies can be arranged in a separated testing arrangement and can even combine dies from multiple wafers as part of the combined arrangement. Then, testing can be implemented on the combined test arrangement. |
申请公布号 |
KR20100017103(A) |
申请公布日期 |
2010.02.16 |
申请号 |
KR20097023796 |
申请日期 |
2008.04.15 |
申请人 |
VERIGY (SINGAPORE) PTE. LTD. |
发明人 |
HART ALAN D.;VOLKERINK ERIK;ERICKSON GAYN |
分类号 |
H01L21/66;G01R31/28 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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