发明名称 SAMPLING PROBE EQUIPPED WITH ILLUMINATION DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To improve handling of a sampling probe under an environment hard to access, and of poor illumination. Ž<P>SOLUTION: The sampling probe (11) for detecting leakage gas provided with a hand operation part (14) equipped with a gas flow-in aperture (22), in the hand operation part (14), an illumination device (25) is provided, for illuminating the region distal to the gas flow-in aperture (22) in the measurement state, and the sampling probe (11) is provided with a limiting value switch (34) which controls the illumination device (25) so as to change the illumination, when the amount of the leakage gas exceeds a concentration limited value. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010032550(A) 申请公布日期 2010.02.12
申请号 JP20090257799 申请日期 2009.11.11
申请人 INFICON GMBH 发明人 ROLLFF RANDOLF;KILIAN RALF;LIEBICH JOERN;MOSER NORBERT;ROLFF NORBERT
分类号 G01M3/02;G01M3/20 主分类号 G01M3/02
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