发明名称 |
SPIN TRANSISTOR, RECONFIGURABLE LOGIC CIRCUIT, MAGNETO-RESISTANCE EFFECT ELEMENT, AND MAGNETIC MEMORY |
摘要 |
<P>PROBLEM TO BE SOLVED: To obtain a magneto-resistance variation rate which is as high as possible and influenced as little as possible by temperature variation even when a full-Heusler alloy is used for a magnetic layer. Ž<P>SOLUTION: A spin transistor has: a source portion 15a and a drain portion 15b which are provided on a semiconductor substrate apart from each other, the source portion and drain portion respectively including ferromagnetic multilayer films having first ferromagnetic layers 15a<SB>1</SB>and 15b<SB>1</SB>made of an alloy containing Co and Fe, and second ferromagnetic layers 15a<SB>2</SB>and 15b<SB>2</SB>formed on the first ferromagnetic layers and made of the full-Heusler alloy containing Co and Mn; a gate insulating film 9 provided on the semiconductor substrate between the source portion and drain portion; and a gate electrode 10 provided on the gate insulating film. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
|
申请公布号 |
JP2010034152(A) |
申请公布日期 |
2010.02.12 |
申请号 |
JP20080192507 |
申请日期 |
2008.07.25 |
申请人 |
TOSHIBA CORP |
发明人 |
SAITO YOSHIAKI;IGUCHI TOMOAKI;SUGIYAMA HIDEYUKI;ISHIKAWA MIZUE;MARUGAME TAKAO |
分类号 |
H01L29/82;H01L21/8246;H01L27/105;H01L43/08 |
主分类号 |
H01L29/82 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|