发明名称 |
METHOD FOR MANUFACTURING SOI SUBSTRATE |
摘要 |
PROBLEM TO BE SOLVED: To improve bonding strength and reliability of an SOI substrate in bonding a semiconductor substrate and a base substrate to each other even when an insulating film containing nitrogen is used as a bonding layer. SOLUTION: An oxide film is provided on a semiconductor substrate side, a nitrogen-containing layer is provided on a base substrate side, and the oxide film formed on the semiconductor substrate and the nitrogen-containing layer formed on the base substrate are bonded to each other. Further, plasma treatment is performed to at least one of the oxide film and the nitrogen-containing layer before bonding the oxide film formed on the semiconductor substrate and the nitrogen-containing layer formed on the base substrate to each other. The plasma treatment can be performed with a bias voltage applied. COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2010034523(A) |
申请公布日期 |
2010.02.12 |
申请号 |
JP20090139952 |
申请日期 |
2009.06.11 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
ONUMA HIDETO;MAKINO KENICHIRO;IIKUBO YOICHI;NAGAI MASAHARU;SHIGA AIKO |
分类号 |
H01L21/02;G02F1/1333;G02F1/1368;H01L21/20;H01L21/265;H01L21/322;H01L21/336;H01L27/12;H01L29/786;H01L51/50;H05B33/02 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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