发明名称 METHOD FOR MANUFACTURING SOI SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To improve bonding strength and reliability of an SOI substrate in bonding a semiconductor substrate and a base substrate to each other even when an insulating film containing nitrogen is used as a bonding layer. SOLUTION: An oxide film is provided on a semiconductor substrate side, a nitrogen-containing layer is provided on a base substrate side, and the oxide film formed on the semiconductor substrate and the nitrogen-containing layer formed on the base substrate are bonded to each other. Further, plasma treatment is performed to at least one of the oxide film and the nitrogen-containing layer before bonding the oxide film formed on the semiconductor substrate and the nitrogen-containing layer formed on the base substrate to each other. The plasma treatment can be performed with a bias voltage applied. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010034523(A) 申请公布日期 2010.02.12
申请号 JP20090139952 申请日期 2009.06.11
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 ONUMA HIDETO;MAKINO KENICHIRO;IIKUBO YOICHI;NAGAI MASAHARU;SHIGA AIKO
分类号 H01L21/02;G02F1/1333;G02F1/1368;H01L21/20;H01L21/265;H01L21/322;H01L21/336;H01L27/12;H01L29/786;H01L51/50;H05B33/02 主分类号 H01L21/02
代理机构 代理人
主权项
地址