PURPOSE: An array test device is provided to enable a detecting unit to measure the amount of light passing a modulator in order to accurately determine whether an electrode of a panel is defective, thereby increasing reliability during a process for detecting a defect of the panel of the array test device. CONSTITUTION: At least one modulator(110) is arranged in a direction of one side of a substrate(10) to be tested. The modulator is moved along with the first axis. At least one light source(120) is formed in a size corresponding to the modulator. The light source is arranged to emit light to each modulator in a direction of the other side of the substrate. When testing the substrate, the light source is moved to be located at the same location as the modulator. A modulator transfer module(130) transfers the modulator toward the first axis.
申请公布号
KR20100015248(A)
申请公布日期
2010.02.12
申请号
KR20080076203
申请日期
2008.08.04
申请人
TOP ENGINEERING CO., LTD.
发明人
BAN, JUN HO;JUNG, DONG CHUL;CHOI, YUN KYU;BANG, KYU YONG;JANG, MOON JU