发明名称 CDS CIRCUIT OF SOLID-STATE IMAGING ELEMENT
摘要 <P>PROBLEM TO BE SOLVED: To provide a CDS circuit of a solid-state imaging element, which has a configuration hardly increasing a device area while improving offset to be generated in reading in a horizontal signal line in a CDS circuit for each column even in the solid-state imaging element such as a multi-pixel CMOS sensor. Ž<P>SOLUTION: A signal outputted to a C-point charges a capacitor C4 during a period when a switch SW5 is in an on-state. Then the capacitor C5 is reset by VREF through a SW8, and the terminal voltage of the capacitor C5 is outputted to a horizontal signal line 13 through an amplifier 12 and a SW9. The terminal voltage of the capacitor C4 is transferred to the capacitor C5 after resetting through a SW 6, charged, and then, outputted to the horizontal signal line 13. A circuit part 15 supplies a signal with kTC noise suppressed therein to a CDS circuit part 14 at the end of the horizontal signal line. The CDS circuit part 14 performs CDS processing to subtract the output voltages of the horizontal signal line 13 at prescribed time intervals, thereby achieving offset correction. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010034813(A) 申请公布日期 2010.02.12
申请号 JP20080194328 申请日期 2008.07.29
申请人 VICTOR CO OF JAPAN LTD 发明人 SHIMIZU TAKESHI
分类号 H04N5/335;H04N5/357;H04N5/363;H04N5/374;H04N5/376;H04N5/378 主分类号 H04N5/335
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