发明名称 RESIST LOWER LAYER FILM FORMING COMPOSITION FOR ELECTRON LITHOGRAPHY
摘要 <p>[PROBLEMS]To provide a resist lower layer film composition for electron lithography, which is to be used in a device manufacturing process using electron lithography, reduces adverse effects due to electron beams and is effective for obtaining an excellent resist pattern, and to provide a resist pattern forming method wherein such composition is used.[MEANS FOR SOLVING PROBLEMS]The resist lower layer film forming composition for electron lithography contains a polymeric compound, which has a repeated unit structure containing halogen atoms, and a solvent. The composition is used for manufacturing semiconductor devices, by being formedbetween a process target film, which forms a transfer pattern on a substrate, and an electron lithography resist film. The polymeric compound contains at least halogen atoms of 10 mass %.</p>
申请公布号 KR20100015316(A) 申请公布日期 2010.02.12
申请号 KR20097019058 申请日期 2008.02.19
申请人 NISSAN CHEMICAL INDUSTRIES, LTD. 发明人 ENOMOTO TOMOYUKI;SAKAGUCHI TAKAHIRO;SAKAMOTO RIKIMARU;NAGAI MASAKI
分类号 G03F7/11;H01L21/027 主分类号 G03F7/11
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