发明名称 CIRCUIT BOARD INSPECTING DEVICE AND CIRCUIT BOARD INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To improve inspection efficiency for a circuit board having a variety of conductor patterns. SOLUTION: When an insulation state is determined to be satisfactory in a first insulation inspection for inspecting the insulation state, between conductor patterns (P1-P5) in a first conductor pattern group Gf and conductor patterns (P6-P10) in a second conductor pattern group Gs, continuity inspection for inspecting the continuity state of a continuity inspection object pattern Pc, selected from either of conductor pattern groups Gf, Gs or a second insulation inspection for inspecting the insulation state between each conductor pattern in the third conductor pattern group Gt and a second insulation inspection object pattern Pi are performed in parallel. The third conductor pattern group Gt is constituted, by conductor patterns which are part or all of the conductor patterns except one second insulation inspection object pattern Pi selected from the other of both conductor pattern groups Gf, Gs and excluding the continuity inspection object pattern Pc and which include all conductor patterns in the other conductor pattern group. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010032286(A) 申请公布日期 2010.02.12
申请号 JP20080193136 申请日期 2008.07.28
申请人 HIOKI EE CORP 发明人 SHIMIZU TAKAHIRO
分类号 G01R31/02;H05K3/00 主分类号 G01R31/02
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