发明名称 Method of Manufacturing a Resistivity Changing Memory Cell, Resistivity Changing Memory Cell, Integrated Circuit, and Memory Module
摘要 According to an embodiment, a method of manufacturing an integrated circuit including a plurality of resistivity changing memory cells is provided. The method includes: forming a stack of layers including a resistivity changing layer, a first conductive layer, a second conductive layer, and a patterned masking layer which are stacked above each other in this order; patterning the second conductive layer using the masking layer as a patterning mask; patterning the first conductive layer using the second conductive layer as a patterning mask; and patterning the resistivity changing layer using the first conductive layer as a patterning mask.
申请公布号 US2010032642(A1) 申请公布日期 2010.02.11
申请号 US20080187258 申请日期 2008.08.06
申请人 PARK CHANRO;LEUSCHNER RAINER 发明人 PARK CHANRO;LEUSCHNER RAINER
分类号 H01L21/283;H01L45/00 主分类号 H01L21/283
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