MOUNTING METHOD FOR MANUFACTURING AN ANALYSIS SYSTEM

摘要

The invention relates to a mounting method for manufacturing an analysis system comprising a meter (46) and an optics unit (52) between the meter (46) and a measurement point, wherein the optics unit (52) is positioned at a support part (36) relative to a light source (42) of the meter (46), wherein during positioning the radiation source (42) is activated and the relative position of the optics unit (52) and the radiation source (42) is varied by way of a positioning device (20) until electromagnetic radiation from the radiation source (42) impinges on the measurement point.